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W. Robert Daasch, C. Glenn Shirley, Amit Nahar, "Statistics in Semiconductor Test: Going beyond Yield," IEEE Design & Test of Computers, vol. 26, no. 5, pp. 6473, September/October, 2009.  
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@article{ 10.1109/MDT.2009.123, author = {W. Robert Daasch and C. Glenn Shirley and Amit Nahar}, title = {Statistics in Semiconductor Test: Going beyond Yield}, journal ={IEEE Design & Test of Computers}, volume = {26}, number = {5}, issn = {07407475}, year = {2009}, pages = {6473}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2009.123}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  MGZN JO  IEEE Design & Test of Computers TI  Statistics in Semiconductor Test: Going beyond Yield IS  5 SN  07407475 SP64 EP73 EPD  6473 A1  W. Robert Daasch, A1  C. Glenn Shirley, A1  Amit Nahar, PY  2009 KW  statistical test KW  design and test KW  statistical modeling KW  multisite testing KW  burnin KW  outlier identification KW  outlier screening KW  data mining VL  26 JA  IEEE Design & Test of Computers ER   
Editor's note:
The quantity and complexity of data generated at each test manufacturing step can be daunting. This article, which emerged from a tutorial presented at ITC 2008, explains the application of statistics to help process that data and provides examples of how test has shifted from descriptive to predictive methods.
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