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IEEE Design & Test of Computers
September/October 2009 (vol. 26 no. 5)
ISSN: 0740-7475
Table of Contents
Departments
Special Issue
Pingqiang Zhou, University of Minnesota, Twin Cities
Karthikk Sridharan, University of Minnesota, Twin Cities
Sachin S. Sapatnekar, University of Minnesota, Twin Cities
pp. 15-25
Hsien-Hsin S. Lee, Georgia Institute of Technology
Krishnendu Chakrabarty, Duke University
pp. 26-35
Hongbin Sun, Xi'an Jiaotong University
Jibang Liu, Rensselaer Polytechnic
Nanning Zheng, Xi'an Jiaotong University
Jian-Qiang Lu, Rensselaer Polytechnic
Kenneth Rose, Rensselaer Polytechnic
Tong Zhang, Rensselaer Polytechnic
pp. 36-47
Special ITC Section
W. Robert Daasch, Portland State University
C. Glenn Shirley, Portland State University
Amit Nahar, Texas Instruments
pp. 64-73
Kenneth M. Butler, Texas Instruments
John M. Carulli Jr., Texas Instruments
Jayashree Saxena, Texas Instruments
Amit Nahar, Texas Instruments
W. Robert Daasch, Portland State University
pp. 74-82
Other Features
Martin Ruckert, Munich University of Applied Sciences
Axel Böttcher, Munich University of Applied Sciences
pp. 83-91
Hao Yu, Berkeley Design Automation
Lei He, University of California, Los Angeles
Mau-Chung Frank Chang, University of California, Los Angeles
pp. 92-104
David S. Kung, IBM T.J. Watson Research Center
pp. 112
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