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Issue No.03 - May/June (2009 vol.26)
pp: 78-86
Vladimir A. Zivkovic , NXP Semiconductors
Jan Schat , NXP Semiconductors
Frank van der Heyden , NXP Semiconductors
Geert Seuren , NXP Semiconductors
ABSTRACT
<p>This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.</p>
INDEX TERMS
mixed-signal test, DFT architecture, computer-aided test, core-based test
CITATION
Vladimir A. Zivkovic, Jan Schat, Frank van der Heyden, Geert Seuren, "Core-Based Testing of Embedded Mixed-Signal Modules in a SoC", IEEE Design & Test of Computers, vol.26, no. 3, pp. 78-86, May/June 2009, doi:10.1109/MDT.2009.55
REFERENCES
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