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Core-Based Testing of Embedded Mixed-Signal Modules in a SoC
May/June 2009 (vol. 26 no. 3)
pp. 78-86
Vladimir A. Zivkovic, NXP Semiconductors
Jan Schat, NXP Semiconductors
Frank van der Heyden, NXP Semiconductors
Geert Seuren, NXP Semiconductors

This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.

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Index Terms:
mixed-signal test, DFT architecture, computer-aided test, core-based test
Citation:
Vladimir A. Zivkovic, Jan Schat, Frank van der Heyden, Geert Seuren, "Core-Based Testing of Embedded Mixed-Signal Modules in a SoC," IEEE Design & Test of Computers, vol. 26, no. 3, pp. 78-86, May-June 2009, doi:10.1109/MDT.2009.55
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