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Issue No.03 - May/June (2009 vol.26)
pp: 25-37
Anuja Sehgal , Nvidia
ABSTRACT
<p>Editor's note:</p><p>Containing production cost is a major concern for today's complex SoCs. One of the key contributors to production cost is test time and test data volume, for which numerous compression techniques were proposed. This article introduces a different approach to test data volume reduction, namely the use of modular test based on IEEE Std 1500 architecture, and it provides modeling, analysis, and quantification to support the proposed approach.</p><p align="right"><it>—Yervant Zorian, VirageLogic</it></p>
INDEX TERMS
modular testing, monolithic testing, IEEE Std 1500, test data volume, SoC testing, test application time, logic cores
CITATION
Erik Jan Marinissen, Anuja Sehgal, Jeff Fitzgerald, Jeff Rearick, "Test Data Volume Comparison: Monolithic vs. Modular SoC Testing", IEEE Design & Test of Computers, vol.26, no. 3, pp. 25-37, May/June 2009, doi:10.1109/MDT.2009.65
REFERENCES
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2. O. Sinanoglu and E.J. Marinissen, "Analysis of the Test Data Volume Reduction Benefit of Modular SoC Testing," Proc. Design, Automation and Test in Europe Conf. (DATE 08), IEEE CS Press, 2008, pp. 182-187.
3. A. Sehgal, J. Fitzgerald, and J. Rearick, "Test Cost Reduction for the AMD Athlon Processor Using Test Partitioning," Proc. Int'l Test Conf. (ITC 07), IEEE CS Press, 2007, paper 1.3.
4. F. Brglez, D. Bryan, and K. Kozminski, "Combinational Profiles of Sequential Benchmark Circuits," Proc. Int'l Symp. Circuits and Systems (ISCAS 89), vol. 14, no. 2, IEEE Press, 1989, pp. 1929-1934.
5. E.J. Marinissen, V. Iyengar, and K. Chakrabarty, "A Set of Benchmarks for Modular Testing of SoCs," Proc. Int'l Test Conf. (ITC 02), IEEE CS Press, 2002, pp. 519-528.
6. M.L. Bushnell and V.D. Agrawal, Essentials of Electronic Testing for Digital Memory &Mixed-Signal VLSI Circuits, Series: Frontiers in Electronics Testing, Kluwer Academic Publishers, 2000.
7. S.K. Goel and E.J. Marinissen, "SoC Test Architecture Design for Efficient Utilization of Test Bandwidth," ACM Trans. Design Automation of Electronic Systems, vol. 8, no. 4, 2003, pp. 399-429.
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