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Automating IEEE 1500 Core Test—An EDA Perspective
May/June 2009 (vol. 26 no. 3)
pp. 6-15
Krishna Chakravadhanula, Cadence Design Systems
Vivek Chickermane, Cadence Design Systems

Editor's note:

Standardized design and test practices enable automation. This article describes a methodology and corresponding tool set that combines automated support for IEEE Std 1500 and test data compression in one.

—Erik Jan Marinissen, IMEC

1. IEEE Std 1500, IEEE Standard for Embedded Core Test (SECT), IEEE, 2005;
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10. C. Barnhart et al., "Extending OPMISR beyond 10x Scan Test Efficiency," IEEE Design &Test, vol. 19, no. 5, 2002, pp. 65-73.
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Index Terms:
IEEE Std 1500, core test, EDA, test data compression
Krishna Chakravadhanula, Vivek Chickermane, "Automating IEEE 1500 Core Test—An EDA Perspective," IEEE Design & Test of Computers, vol. 26, no. 3, pp. 6-15, May-June 2009, doi:10.1109/MDT.2009.47
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