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Issue No.03 - May/June (2009 vol.26)
pp: 4
Yervant Zorian , Virage Logic
ABSTRACT
In this issue, IEEE Design and Test presents Part 2 of the status of IEEE Std 1500, with three articles concluding our double special issue.
INDEX TERMS
IEEE Design and Test, IEEE Std 1500 Part 2
CITATION
Erik Jan Marinissen, Yervant Zorian, "Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2", IEEE Design & Test of Computers, vol.26, no. 3, pp. 4, May/June 2009, doi:10.1109/MDT.2009.60
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