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| "Metamodeling for model- based system design," IEEE Design & Test of Computers, vol. 26, no. 3, pp. 2, May/June, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2009.61, author = {}, title = {Metamodeling for model- based system design}, journal ={IEEE Design & Test of Computers}, volume = {26}, number = {3}, issn = {0740-7475}, year = {2009}, pages = {2}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2009.61}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Metamodeling for model- based system design IS - 3 SN - 0740-7475 SP EP EPD - 2 PY - 2009 KW - design and test KW - IEEE Std 1500 KW - metamodeling KW - debug KW - test development VL - 26 JA - IEEE Design & Test of Computers ER - | |||
Metamodeling, which can be defined as the construction of a collection of concepts within a certain domain, originated in the field of mathematical logic, and software engineering research has actively applied this approach for model-driven software design. Increasingly, it is used in electronic system design as a result of our never-ending need to move the abstraction level of design ever higher. Some experts believe that there will be increasing use of metamodels for supporting automated system integration, system test generation, and verification. The May/June issue of Design & Test features a special section on metamodeling, with two survey articles on the topic. This issue also is a special issue concluding "IEEE 1500 and Its Usage," the first part of which ran in the January/February issue. In addition, there are two general-interest articles: one addresses a silicon debug approach for a high-performance server chipset; the second discusses test development for embedded mixed-signal and RF modules.