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Design&Test
2009
Issue No. 3 - May/June

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IEEE Design & Test of Computers

May/June 2009 (vol. 26 no. 3)

ISSN: 0740-7475

Table of Contents

From the EIC

Metamodeling for model- based system design (HTML)

pp. 2

ABSTRACT

PDF

HTML

Call for Papers

Call for Papers (HTML)

pp. 5

ABSTRACT

PDF

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Special Issue

Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2 (HTML)

Erik Jan Marinissen, IMEC

Yervant Zorian, Virage Logic

pp. 4

ABSTRACT

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IEEE Std 1500 and Its Usage - Part 2

Automating IEEE 1500 Core Test—An EDA Perspective (Abstract)

Krishna Chakravadhanula, Cadence Design Systems

Vivek Chickermane, Cadence Design Systems

pp. 6-15

ABSTRACT

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PURCHASE ARTICLE: $19

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Are IEEE-1500-Compliant Cores Really Compliant to the Standard? (Abstract)

Alfredo Benso, Politecnico di Torino

Alberto Bosio, LIRMM

Stefano Di Carlo, Politecnico di Torino

Paolo Prinetto, Politecnico di Torino

pp. 16-24

ABSTRACT

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Test Data Volume Comparison: Monolithic vs. Modular SoC Testing (Abstract)

Ozgur Sinanoglu, Kuwait University

Erik Jan Marinissen, IMEC

Anuja Sehgal, Nvidia

Jeff Fitzgerald, AMD

Jeff Rearick, AMD

pp. 25-37

ABSTRACT

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HTML

PURCHASE ARTICLE: $19

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Metamodels in Europe: Languages, Tools, and Applications (Abstract)

Roberto Passerone, University of Trento

Imene Ben Hafaiedh, Verimag

Susanne Graf, Verimag

Albert Benveniste, INRIA Rennes

Daniela Cancila, CEA LIST

Arnaud Cuccuru, CEA LIST

Sébastien Gérard, CEA LIST

Francois Terrier, CEA LIST

Werner Damm, Oldenburg University

Alberto Ferrari, Parades

Leonardo Mangeruca, Parades

Bernhard Josko, OFFIS

Thomas Peikenkamp, OFFIS

Alberto Sangiovanni-Vincentelli, University of California, Berkeley

pp. 38-53

ABSTRACT

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Metamodeling: An Emerging Representation Paradigm for System-Level Design (Abstract)

Alberto Sangiovanni-Vincentelli, University of California, Berkeley

Sandeep Kumar Shukla, Virginia Polytechnic and State University

Janos Sztipanovits, Vanderbilt University

Guang Yang, National Instruments

Deepak A. Mathaikutty, Intel

pp. 54-69

ABSTRACT

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Other Features

Comprehensive Approach to High-Performance Server Chipset Debug (Abstract)

Ishwar Parulkar, Sun Microsystems

Babu Turumella, Sun Microsystems

pp. 70-77

ABSTRACT

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Core-Based Testing of Embedded Mixed-Signal Modules in a SoC (Abstract)

Vladimir A. Zivkovic, NXP Semiconductors

Jan Schat, NXP Semiconductors

Frank van der Heyden, NXP Semiconductors

Geert Seuren, NXP Semiconductors

pp. 78-86

ABSTRACT

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HTML

PURCHASE ARTICLE: $19

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Departments

DATE 2009 Workshop on 3D Integration (HTML)

Peggy Aycinena, EDA Confidential

pp. 87-87

ABSTRACT

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CEDA Currents (HTML)

pp. 88-90

ABSTRACT

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DATC Newsletter (HTML)

pp. 91

ABSTRACT

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Book Review: A book on system test, and testing systems also (HTML)

Scott Davidson, Sun Microsystems

pp. 92-93

ABSTRACT

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Test Technology TC Newsletter (HTML)

pp. 94-95

ABSTRACT

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Metamodeling: What is it good for? (Abstract)

Sandeep Shukla, Virginia Tech

pp. 96

ABSTRACT

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