Advanced Search 
IEEE Design & Test of Computers
May/June 2009 (vol. 26 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
Call for Papers
Special Issue
IEEE Std 1500 and Its Usage - Part 2
Alberto Sangiovanni-Vincentelli, University of California, Berkeley
Sandeep Kumar Shukla, Virginia Polytechnic and State University
Janos Sztipanovits, Vanderbilt University
Guang Yang, National Instruments
pp. 54-69
Other Features
Usage of this product signifies your acceptance of the Terms of Use.