This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Computing and Minimizing Cache Vulnerability to Transient Errors
March/April 2009 (vol. 26 no. 2)
pp. 44-51
Wei Zhang, Southern Illinois University Carbondale

Using a cache vulnerability factor to measure the susceptibility of cache memories to transient errors at the architecture level can help designers make appropriate cost and reliability trade-offs at early design cycles. Two early write-back strategies can also improve the reliability of write-back data caches without compromising performance.

1. S.S. Mukherjee et al., "A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor," Proc. IEEE/ACM Int'l Symp. Microarchitecture (MICRO 03), IEEE CS Press, 2003, pp. 29-40.
2. S.S. Mukherjee, J. Emer, and S.K. Reinhardt, "The Soft Error Problem: An Architectural Perspective," Proc. 11th Int'l Symp. High-Performance Computer Architecture (HPCA 05), IEEE CS Press, 2005, pp. 243-247.
3. S. Kaxiras, Z. Hu, and M. Martonosi, "Cache Decay: Exploiting Generational Behavior to Reduce Cache Leakage Power," Proc. 28th Int'l Symp. Computer Architecture (ISCA 01), IEEE CS Press, 2001, pp. 240-251.
4. T. Sherwood et al., "Automatically Characterizing Large Scale Program Behavior," Proc. 10th Int'l Conf. Architectural Support for Programming Languages and Operating Systems (ASPLOS 02), ACM Press, 2002, pp. 45-57.
5. H.S. Lee et al., "Eager Writeback: A Technique for Improving Bandwidth Utilization," Proc. IEEE/ACM Int'l Symp. Microarchitecture (MICRO 00), IEEE CS Press, 2000, pp. 11-21.
6. L. Li et al., "Soft Error and Energy Consumption Interactions: A Data Cache Perspective," Proc. Int'l Symp. Low Power Electronics and Design (ISLPED 04), IEEE CS Press, 2004, pp. 132-137.

Citation:
Wei Zhang, "Computing and Minimizing Cache Vulnerability to Transient Errors," IEEE Design & Test of Computers, vol. 26, no. 2, pp. 44-51, March-April 2009, doi:10.1109/MDT.2009.29
Usage of this product signifies your acceptance of the Terms of Use.