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A second course on testing
January/February 2009 (vol. 26 no. 1)
pp. 98-101
Scott Davidson, Sun Microsystems
This is a review of System on Chip Test Architectures: Nanometer Design for Testability (edited by Laung-Terng Wang, Charles E. Stroud, and Nur A. Touba). Overall, this is a good guide to the frontiers of test. For most of the chapters, the selection of subjects and the detail level is just right, largely because this book is a follow-on to a more introductory book, VLSI Test Principles and Architectures. If one of the more basic books on testing is not adequate for your requirements, this text would make a nice addition to your library. It would also do well as a text in an advanced graduate course.
Index Terms:
SoC, test architecture, MEMS, DFT, SiP, TAM, random access scan, FPGA, nanotechnologies
Citation:
Scott Davidson, "A second course on testing," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 98-101, Jan.-Feb. 2009, doi:10.1109/MDT.2009.2
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