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Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor
January/February 2009 (vol. 26 no. 1)
pp. 52-59
Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.

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Index Terms:
quad-core AMD microprocessor, test access mechanism, embedded-core testing, microprocessor testing, test compression, SoC testing
Citation:
Kedarnath J. Balakrishnan, Grady Giles, James Wingfield, "Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 52-59, Jan.-Feb. 2009, doi:10.1109/MDT.2009.17
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