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CTL and Its Usage in the EDA Industry
January/February 2009 (vol. 26 no. 1)
pp. 36-43
ASCII Text
x 
 
Rohit Kapur, Paul Reuter, Sandeep Bhatia, Brion Keller, "CTL and Its Usage in the EDA Industry," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 36-43, January/February, 2009.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2009.8,
author = {Rohit Kapur and Paul Reuter and Sandeep Bhatia and Brion Keller},
title = {CTL and Its Usage in the EDA Industry},
journal ={IEEE Design & Test of Computers},
volume = {26},
number = {1},
issn = {0740-7475},
year = {2009},
pages = {36-43},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2009.8},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - CTL and Its Usage in the EDA Industry
IS - 1
SN - 0740-7475
SP36
EP43
EPD - 36-43
A1 - Rohit Kapur,
A1 - Paul Reuter,
A1 - Sandeep Bhatia,
A1 - Brion Keller,
PY - 2009
KW - Core Test Language
KW - CTL
KW - IEEE Std 1500
KW - EDA industry
KW - ATPG
KW - test reuse
KW - test synthesis
VL - 26
JA - IEEE Design & Test of Computers
ER -
 
Rohit Kapur, Synopsys
Paul Reuter, Mentor Graphics
Sandeep Bhatia, Cadence Design Systems
Brion Keller, Cadence Design Systems
The Core Test Language, originally developed within the IEEE 1500 development working group but later spun out as an independent standard, specifies the standardized language in which core test information for both wrapped and still-to-be-wrapped cores is described.

1. E.J. Marinissen et al., "Towards a Standard for Embedded Core Test: An Example," Proc. Int'l Test Conf. (ITC 99), IEEE CS Press, 1999, pp. 616-627.
2. E.J. Marinissen, R. Kapur, and Y. Zorian, "On Using IEEE P1500 SECT for Test Plug-n-Play," Proc. Int'l Test Conf. (ITC 00), IEEE CS Press, 2000, pp. 770-777.
3. IEEE Std 1450.6-2005, IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL), IEEE, 2006.
4. IEEE Std 1500-2005, IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits, IEEE, 2006.
5. M. Keating and P. Bricaud, Reuse Methodology Manual: For System-on-a-Chip Designs, 3rd ed., Springer, 2002.
6. IEEE Std 1450-1999, IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data, IEEE Computer Society, 1999.

Index Terms:
Core Test Language, CTL, IEEE Std 1500, EDA industry, ATPG, test reuse, test synthesis
Citation:
Rohit Kapur, Paul Reuter, Sandeep Bhatia, Brion Keller, "CTL and Its Usage in the EDA Industry," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 36-43, Jan.-Feb. 2009, doi:10.1109/MDT.2009.8
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