This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
CTL and Its Usage in the EDA Industry
January/February 2009 (vol. 26 no. 1)
pp. 36-43
Rohit Kapur, Synopsys
Paul Reuter, Mentor Graphics
Sandeep Bhatia, Cadence Design Systems
Brion Keller, Cadence Design Systems
The Core Test Language, originally developed within the IEEE 1500 development working group but later spun out as an independent standard, specifies the standardized language in which core test information for both wrapped and still-to-be-wrapped cores is described.

1. E.J. Marinissen et al., "Towards a Standard for Embedded Core Test: An Example," Proc. Int'l Test Conf. (ITC 99), IEEE CS Press, 1999, pp. 616-627.
2. E.J. Marinissen, R. Kapur, and Y. Zorian, "On Using IEEE P1500 SECT for Test Plug-n-Play," Proc. Int'l Test Conf. (ITC 00), IEEE CS Press, 2000, pp. 770-777.
3. IEEE Std 1450.6-2005, IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL), IEEE, 2006.
4. IEEE Std 1500-2005, IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits, IEEE, 2006.
5. M. Keating and P. Bricaud, Reuse Methodology Manual: For System-on-a-Chip Designs, 3rd ed., Springer, 2002.
6. IEEE Std 1450-1999, IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data, IEEE Computer Society, 1999.

Index Terms:
Core Test Language, CTL, IEEE Std 1500, EDA industry, ATPG, test reuse, test synthesis
Citation:
Rohit Kapur, Paul Reuter, Sandeep Bhatia, Brion Keller, "CTL and Its Usage in the EDA Industry," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 36-43, Jan.-Feb. 2009, doi:10.1109/MDT.2009.8
Usage of this product signifies your acceptance of the Terms of Use.