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Issue No.01 - January/February (2009 vol.26)
pp: 8-17
Yervant Zorian , Virage Logic
IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.
IEEE Std 1500, SoC, manufacturing test, modular testing, wrapper, test access mechanism
Erik Jan Marinissen, Yervant Zorian, "IEEE Std 1500 Enables Modular SoC Testing", IEEE Design & Test of Computers, vol.26, no. 1, pp. 8-17, January/February 2009, doi:10.1109/MDT.2009.12
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13. Y. Zorian and S. Shoukourian, "Embedded Memory Test and Repair: Infrastructure IP for SoC Yield," IEEE Design &Test, vol. 20, no. 3, May-June 2003, pp. 58-66.
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