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Issue No.01 - January/February (2009 vol.26)
pp: 4
ABSTRACT
IEEE Std 1500 supports cost-efficient testing of core-based SoCs. Several popular commercial cores have incorporated IEEE-1500-compliant wrappers, and many complex SoC designs have successfully employed a modular-testing strategy enabled by this standard. This special issue examines the usage experiences of this important standard. Also included in this issue of D&T is a Perspectives article from Intel's Gadi Singer on emerging computing trends, challenges of nanoscale device integration, and the resulting gigascale complexity. In addition, there are three general-interest articles on various topics.
INDEX TERMS
IEEE Std 1500, embedded reusable cores, IP blocks, modular testing, Gadi Singer, gigascale complexity
CITATION
"IEEE Std 1500 enables core-based SoC test development", IEEE Design & Test of Computers, vol.26, no. 1, pp. 4, January/February 2009, doi:10.1109/MDT.2009.11
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