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| "IEEE Std 1500 enables core-based SoC test development," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 4-4, January/February, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2009.11, author = {}, title = {IEEE Std 1500 enables core-based SoC test development}, journal ={IEEE Design & Test of Computers}, volume = {26}, number = {1}, issn = {0740-7475}, year = {2009}, pages = {4-4}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2009.11}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - IEEE Std 1500 enables core-based SoC test development IS - 1 SN - 0740-7475 SP4 EP4 EPD - 4-4 PY - 2009 KW - IEEE Std 1500 KW - embedded reusable cores KW - IP blocks KW - modular testing KW - Gadi Singer KW - gigascale complexity VL - 26 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2009.11
IEEE Std 1500 supports cost-efficient testing of core-based SoCs. Several popular commercial cores have incorporated IEEE-1500-compliant wrappers, and many complex SoC designs have successfully employed a modular-testing strategy enabled by this standard. This special issue examines the usage experiences of this important standard. Also included in this issue of D&T is a Perspectives article from Intel's Gadi Singer on emerging computing trends, challenges of nanoscale device integration, and the resulting gigascale complexity. In addition, there are three general-interest articles on various topics.
Index Terms:
IEEE Std 1500, embedded reusable cores, IP blocks, modular testing, Gadi Singer, gigascale complexity
Citation:
"IEEE Std 1500 enables core-based SoC test development," IEEE Design & Test of Computers, vol. 26, no. 1, pp. 4-4, Jan.-Feb. 2009, doi:10.1109/MDT.2009.11
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