|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
Annual Index
November-December 2008 (vol. 25 no. 6)
pp. 0
| ASCII Text | x | ||
| "Annual Index," IEEE Design & Test of Computers, vol. 25, no. 6, pp. 0, November-December, 2008. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2008.175, author = {}, title = {Annual Index}, journal ={IEEE Design & Test of Computers}, volume = {25}, number = {6}, issn = {0740-7475}, year = {2008}, pages = {0}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.175}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Annual Index IS - 6 SN - 0740-7475 SP EP EPD - 0 PY - 2008 VL - 25 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.175
Citation:
"Annual Index," IEEE Design & Test of Computers, vol. 25, no. 6, pp. 0, Nov.-Dec. 2008, doi:10.1109/MDT.2008.175
Usage of this product signifies your acceptance of the Terms of Use.