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Issue No.06 - November-December (vol.25)
ISSN: 0740-7475
TABLE OF CONTENTS
High-Performance Switches
Call for Papers
David Kung , (IBM Research)
Yuan Xie , (Pennsylvania State University)
pp. 505
From the EIC
Roundtables
Wafer-Level Test
William R. Mann , Rockwell International (Retired)
pp. 528-537
High-Performance Switches
Mohammad Tehranipoor , University of Connecticut, Storrs
Reza M.P. Rad , University of Maryland, Baltimore County
pp. 549-559
Test Time Reduction
Jen-Chieh Yeh , Industrial Technology Research Institute
Shuo-Fen Kuo , Realtek Semiconductor
Chao-Hsun Chen , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 560-570
Globally Asynchronous, Locally Synchronous Design
Abbas Sheibanyrad , TIMA Laboratory
Alain Greiner , Laboratoire d'Informatique de Paris 6
Ivan Miro-Panades , French Atomic Energy Commission, Grenoble
pp. 572-580
Stefan Valentin Gheorghita , Google Switzerland
Twan Basten , Eindhoven University of Technology
Henk Corporaal , Eindhoven University of Technology
pp. 581-589
Embedded Systems
Ted Huffmire , Naval Postgraduate School
Brett Brotherton , Special Technologies Laboratory
Timothy Sherwood , University of California, Santa Barbara
Ryan Kastner , University of California, San Diego
Timothy Levin , Naval Postgraduate School
Thuy D. Nguyen , Naval Postgraduate School
Cynthia Irvine , Naval Postgraduate School
pp. 590-598
Design Automation Technical Committee Newsletter
Book Reviews
Grant Martin , Tensilica
pp. 600-601
Test Technology TC Newsletter
CEDA Currents
CEDA Currents (HTML)
pp. 604-606
The Last Byte
Melvin A. Breuer , University of Southern California
pp. 608-609
Annual Index
Annual Index (Abstract)
pp. 0
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