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| Leon Stok, "Variability and New Design Paradigms," IEEE Design & Test of Computers, vol. 25, no. 4, pp. 344, July-August, 2008. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2008.115, author = {Leon Stok}, title = {Variability and New Design Paradigms}, journal ={IEEE Design & Test of Computers}, volume = {25}, number = {4}, issn = {0740-7475}, year = {2008}, pages = {344}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.115}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Variability and New Design Paradigms IS - 4 SN - 0740-7475 SP EP EPD - 344 A1 - Leon Stok, PY - 2008 KW - deterministic era KW - Gigascale Systems Research Center KW - on-chip applications KW - computational paradigms KW - variability KW - reliability VL - 25 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.115
In the late- and post-silicon eras, variation of all nanometer processes will continue to increase significantly. The industry is gradually addressing this situation and exposing more variability information to the designer. According to the Gigascale Systems Research Center, the deterministic era will be over for most on-chip applications and alternatives must be found. The author of this sidebar looks forward to the time when the two will meet: when more revolutionary design techniques will find their way into practical designs, and when one of the computational paradigms will suddenly be needed to cope with an unexpected surge in variability or reliability in a particular design or technology.
Index Terms:
deterministic era, Gigascale Systems Research Center, on-chip applications, computational paradigms, variability, reliability
Citation:
Leon Stok, "Variability and New Design Paradigms," IEEE Design & Test of Computers, vol. 25, no. 4, pp. 344, July-Aug. 2008, doi:10.1109/MDT.2008.115
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