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| Joe Damore, "DATC Newsletter," IEEE Design & Test of Computers, vol. 25, no. 3, pp. 280, May-June, 2008. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2008.63, author = {Joe Damore}, title = {DATC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {25}, number = {3}, issn = {0740-7475}, year = {2008}, pages = {280}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.63}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - DATC Newsletter IS - 3 SN - 0740-7475 SP EP EPD - 280 A1 - Joe Damore, PY - 2008 KW - DATC KW - design automation KW - Electronic Design Processes Workshop KW - IEEE chip design KW - ICSEng KW - SBCCI KW - FDL KW - DSD VL - 25 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.63
This newsletter provides news, events, and information related to the IEEE Computer Society's Design Automation Technical Committee and the EDA community.
Index Terms:
DATC, design automation, Electronic Design Processes Workshop, IEEE chip design, ICSEng, SBCCI, FDL, DSD
Citation:
Joe Damore, "DATC Newsletter," IEEE Design & Test of Computers, vol. 25, no. 3, pp. 280, May-June 2008, doi:10.1109/MDT.2008.63
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