The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.03 - May-June (2008 vol.25)
pp: 204
ABSTRACT
Effective silicon debug is key for time to money. Silicon debug and diagnosis attempt to locate and fix the root causes of failures upon identification of a chip that violates either a functional or timing specification. However, the tasks of silicon debug and diagnosis are becoming increasingly more challenging, and their costs continue to rise for complex SoCs. This issue of IEEE Design & Test features a special issue on silicon debug and diagnosis. This issue also includes a roundtable on thousand-core chips.
INDEX TERMS
silicon, debug, diagnosis, presilicon verification, thousand-core chips
CITATION
Tim Cheng, "Effective silicon debug is key for time to money", IEEE Design & Test of Computers, vol.25, no. 3, pp. 204, May-June 2008, doi:10.1109/MDT.2008.64
34 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool