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The commonality of vector generation techniques
March-April 2008 (vol. 25 no. 2)
pp. 200
Scott Davidson, Sun Microsystems
The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.
Index Terms:
vector generation, test compression, full scan, ATPG, logic BIST, output compression, non-fault-directed test, semi-fault-directed test
Citation:
Scott Davidson, "The commonality of vector generation techniques," IEEE Design & Test of Computers, vol. 25, no. 2, pp. 200, March-April 2008, doi:10.1109/MDT.2008.53
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