Issue No.02 - March-April (2008 vol.25)
Qizhang Yin , Monolithic Power Systems
William R. Eisenstadt , University of Florida
Tian Xia , Spansion
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.57
A wireless, embedded signal delivery system for RF or microwave embedded test of ICs is demonstrated. Compared to conventional RF test methods, the proposed test scheme has the potential benefits of testing multiple circuits simultaneously with a single RF test source and simplified test signal delivery. A preliminary application of this wireless embedded test is presented through an example low-noise amplifier measurement; wireless 5-GHz LNA measurement results agree with network analyzer measurements.
wireless test, RF IC, RF BIST, LNA test, embedded test, microwave test
Qizhang Yin, William R. Eisenstadt, Tian Xia, "Wireless System for Microwave Test Signal Generation", IEEE Design & Test of Computers, vol.25, no. 2, pp. 160-166, March-April 2008, doi:10.1109/MDT.2008.57