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UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting
March-April 2008 (vol. 25 no. 2)
pp. 132-140
ASCII Text
x 
 
Chao-Wen Tzeng, Shi-Yu Huang, "UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting," IEEE Design & Test of Computers, vol. 25, no. 2, pp. 132-140, March-April, 2008.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2008.55,
author = {Chao-Wen Tzeng and Shi-Yu Huang},
title = {UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting},
journal ={IEEE Design & Test of Computers},
volume = {25},
number = {2},
issn = {0740-7475},
year = {2008},
pages = {132-140},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.55},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting
IS - 2
SN - 0740-7475
SP132
EP140
EPD - 132-140
A1 - Chao-Wen Tzeng,
A1 - Shi-Yu Huang,
PY - 2008
KW - test compression
KW - DFT
KW - scan test
KW - broadcasting
KW - multicasting
VL - 25
JA - IEEE Design & Test of Computers
ER -
 
Chao-Wen Tzeng, National Tsing-Hua University
Shi-Yu Huang, National Tsing-Hua University
This article presents a universal-multicasting scan architecture for test compression. By universal multicasting, the authors mean that a specific test pattern can be multicast to a set of any desired scan chains as long as they are compatible. It does require the addition of some extra control bits padded to the compressed test patterns. However, by incorporating techniques such as control pattern encoding, skipping, and partial data reuse, the authors demonstrate that the control overhead can be reduced to a modest level. This method improves the test compression ratio substantially over the recent software-defined multicasting methodology, most notably the segmented addressable scan (SAS). Experimental results indicate that up to 51x test compression ratio in both test data volume and test time can be achieved for a real design with a 1.3% care bit ratio in the test set.

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Index Terms:
test compression, DFT, scan test, broadcasting, multicasting
Citation:
Chao-Wen Tzeng, Shi-Yu Huang, "UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting," IEEE Design & Test of Computers, vol. 25, no. 2, pp. 132-140, March-April 2008, doi:10.1109/MDT.2008.55
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