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VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG
March-April 2008 (vol. 25 no. 2)
pp. 122-130
ASCII Text
x 
 
Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu, "VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG," IEEE Design & Test of Computers, vol. 25, no. 2, pp. 122-130, March-April, 2008.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2008.56,
author = {Laung-Terng Wang and Xiaoqing Wen and Shianling Wu and Zhigang Wang and Zhigang Jiang and Boryau Sheu and Xinli Gu},
title = {VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG},
journal ={IEEE Design & Test of Computers},
volume = {25},
number = {2},
issn = {0740-7475},
year = {2008},
pages = {122-130},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.56},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG
IS - 2
SN - 0740-7475
SP122
EP130
EPD - 122-130
A1 - Laung-Terng Wang,
A1 - Xiaoqing Wen,
A1 - Shianling Wu,
A1 - Zhigang Wang,
A1 - Zhigang Jiang,
A1 - Boryau Sheu,
A1 - Xinli Gu,
PY - 2008
KW - ATPG
KW - scan testing
KW - test compression
KW - combinational broadcaster
KW - combinational compactor
KW - low-power testing
KW - fault diagnosis
VL - 25
JA - IEEE Design & Test of Computers
ER -
 
Laung-Terng Wang, SynTest Technologies
Xiaoqing Wen, Kyushu Institute of Technology
Shianling Wu, SynTest Technologies
Zhigang Wang, Cisco Systems
Zhigang Jiang, SynTest Technologies
Boryau Sheu, SynTest Technologies
Xinli Gu, Cisco Systems
This article describes a test compression technology, called VirtualScan, which achieves scan test cost reduction by inserting a small combinational broadcaster and compactor into the original circuit under test (CUT). In addition, one-pass ATPG takes into account all constraints imposed by the VirtualScan compression architecture, and generates compression test patterns in the same manner as a conventional full-scan ATPG. The simplicity of the combinational-logic-based compression technology further allows for flexibility in addressing unknown (X) values and fault-aliasing effects, through either an enhanced ATPG algorithm or enhanced compactor logic.

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Index Terms:
ATPG, scan testing, test compression, combinational broadcaster, combinational compactor, low-power testing, fault diagnosis
Citation:
Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu, "VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG," IEEE Design & Test of Computers, vol. 25, no. 2, pp. 122-130, March-April 2008, doi:10.1109/MDT.2008.56
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