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Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, JeanLouis Carbonéro, "Decreasing Test Qualification Time in AMS and RF Systems," IEEE Design & Test of Computers, vol. 25, no. 1, pp. 2937, JanuaryFebruary, 2008.  
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@article{ 10.1109/MDT.2008.7, author = {Yves Joannon and Vincent Beroulle and Chantal Robach and Smail Tedjini and JeanLouis Carbonéro}, title = {Decreasing Test Qualification Time in AMS and RF Systems}, journal ={IEEE Design & Test of Computers}, volume = {25}, number = {1}, issn = {07407475}, year = {2008}, pages = {2937}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.7}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  MGZN JO  IEEE Design & Test of Computers TI  Decreasing Test Qualification Time in AMS and RF Systems IS  1 SN  07407475 SP29 EP37 EPD  2937 A1  Yves Joannon, A1  Vincent Beroulle, A1  Chantal Robach, A1  Smail Tedjini, A1  JeanLouis Carbonéro, PY  2008 KW  faultbased test KW  qualification KW  design validation KW  AMS and RF SoCs KW  VHDLAMS KW  behavioral modeling KW  parametric fault injection VL  25 JA  IEEE Design & Test of Computers ER   
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