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IEEE Design & Test of Computers
November-December 2007 (vol. 24 no. 6)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Thomas Eisenbarth, Ruhr University Bochum
Sandeep Kumar, Philips Research Europe
Christof Paar, Ruhr University Bochum
Axel Poschmann, Ruhr University Bochum
Leif Uhsadel, Catholic University of Leuven
pp. 522-533
Thomas Popp, Graz University of Technology
Stefan Mangard, Infineon Technologies
Elisabeth Oswald, University of Bristol
pp. 535-543
Chong Hee Kim, Université Catholique de Louvain
Jean-Jacques Quisquater, Université Catholique de Louvain
pp. 544-545
Sylvain Guilley, École Nationale Supérieure des Télécommunications
Florent Flament, Hewlett-Packard
Philippe Hoogvorst, Centre National de la Recherche Scientifique
Renaud Pacalet, École Nationale Supérieure des Télécommunications
Yves Mathieu, École Nationale Supérieure des Télécommunications
pp. 546-555
G. Edward Suh, Cornell University
Charles W. O'Donnell, Massachusetts Institute of Technology
Srinivas Devadas, Massachusetts Institute of Technology
pp. 570-580
Standards
Book Reviews
CEDA Currents
Conference Reports
DATC Newsletter
TTTC Newsletter
2007 Annual Index
The Last Byte
Tesla and AND gates (Abstract)
Mel Breuer, University of Southern California
pp. 624
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