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IEEE Design & Test of Computers
September-October 2007 (vol. 24 no. 5)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Paul Teehan, University of British Columbia
Mark Greenstreet, University of British Columbia
Guy Lemieux, University of British Columbia
pp. 418-428
Miloš Krstić, IHP Microelectronics
Eckhard Grass, IHP Microelectronics
Frank K. Gürkaynak, Swiss Federal Institute of Technology Lausanne
Pascal Vivet, CEA-LETI
pp. 430-441
Luis A. Plana, University of Manchester
Steve B. Furber, University of Manchester
Steve Temple, University of Manchester
Mukaram Khan, University of Manchester
Yebin Shi, University of Manchester
Jian Wu, University of Manchester
Shufan Yang, University of Manchester
pp. 454-463
Special ITC Section
Jerzy Tyszer, Poznań University of Technology
Janusz Rajski, Mentor Graphics
Grzegorz Mrugalski, Mentor Graphics
Nilanjan Mukherjee, Mentor Graphics
Mark Kassab, Mentor Graphics
Wu-Tung Cheng, Mentor Graphics
Manish Sharma, Mentor Graphics
Liyang Lai, Mentor Graphics
pp. 476-485
Scott Davidson, Sun Microsystems
Helen Davidson, Davidson Decision Resources
pp. 494-501
2007 DAC Report
DAC Highlights (Abstract)
Sachin Sapatnekar, University of Minnesota
Leon Stok, IBM
pp. 502-504
The Last Byte
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