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IEEE Design & Test of Computers
July/August 2007 (vol. 24 no. 4)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Jing Huang, Sun Microsystems
Mariam Momenzadeh, Northeastern University
Fabrizio Lombardi, Northeastern University
pp. 304-311
Smita Krishnaswamy, University of Michigan
Igor L. Markov, University of Michigan
John P. Hayes, University of Michigan
pp. 312-321
Kyung Ki Kim, Northeastern University
Yong-Bin Kim, Northeastern University
Minsu Choi, University of Missouri-Rolla
Nohpill Park, Oklahoma State University, Stillwater
pp. 322-330
Other Features
Arthur Pereira Frantz, Datacom Telecommunications
Maico Cassel, Federal University of Rio Grande do Sul
Fernanda Lima Kastensmidt, Federal University of Rio Grande do Sul
Érika Cota, Federal University of Rio Grande do Sul
Luigi Carro, Federal University of Rio Grande do Sul
pp. 340-350
V.R. Devanathan, Texas Instruments India
C.P. Ravikumar, Texas Instruments India
V. Kamakoti, Indian Institute of Technology, Madras
pp. 374-384
Rei-Fu Huang, MediaTek
Jin-Fu Li, National Central University
Jen-Chieh Yeh, Industrial Technology Research Institute
Cheng-Wen Wu, National Tsing Hua University
pp. 386-396
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