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July/August 2007 (vol. 24 no. 4)
pp. 300
Recent innovations in nanoscale devices offer the potential for greater information density and system functionality. However, such devices present several new challenges. Design methodologies and tools have obtained a tremendous degree of sophistication and predictive value, and there are advantages in using the power of these tools to define a context for evaluating next-generation nanoelectronic technologies. Without a common context of systems evaluation, it will be difficult to make early viability assessments of new nanoelectronic-device approaches, nor will it be possible to strategically guide the development of these new technologies. This issue of IEEE Design & Test offers a special section on such topics. In addition, this issue presents the first in a series of tutorial articles derived from presentations at Test Technology Educational Program (TTEP) conferences. Finally, there are five general-interest articles on a wide range of topics.
Index Terms:
CAD, CMOS, SEU, delay testing, process diagnosis, redundancy
Citation:
Tim Cheng, "Design and CAD for Nanotechnologies," IEEE Design & Test of Computers, vol. 24, no. 4, pp. 300, July-Aug. 2007, doi:10.1109/MDT.2007.130
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