Advanced Search 
IEEE Design & Test of Computers
May-June 2007 (vol. 24 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Jing Wang, Texas A&M University
Duncan M. (Hank) Walker, Texas A&M University
Xiang Lu, P.A. Semi
Ananta Majhi, NXP Semiconductors
Bram Kruseman, NXP Semiconductors
Guido Gronthoud, NXP Semiconductors
Luis Elvira Villagra, NXP Semiconductors
Paul J.A.M. van de Wiel, NXP Semiconductors
Stefan Eichenberger, NXP Semiconductors
pp. 226-234
Karim Arabi, PMC-Sierra
Resve Saleh, University of British Columbia
Xiongfei Meng, University of British Columbia
pp. 236-244
Sanjay Pant, University of Michigan, Ann Arbor
Eli Chiprout, Intel
David Blaauw, University of Michigan, Ann Arbor
pp. 246-254
Santiago Remersaro, University of Iowa
Xijiang Lin, Mentor Graphics
Sudhakar M. Reddy, University of Iowa
Irith Pomeranz, Purdue University
Janusz Rajski, Mentor Graphics
pp. 268-275
Power Droop Testing (Abstract)
Ilia Polian, Albert-Ludwigs University of Freiburg
Alejandro Czutro, Albert-Ludwigs University of Freiburg
Sandip Kundu, University of Massachusetts, Amherst
Bernd Becker, Albert-Ludwigs University of Freiburg
pp. 276-284
The Last Byte
Usage of this product signifies your acceptance of the Terms of Use.