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Issue No.03 - May-June (vol.24)
ISSN: 0740-7475
TABLE OF CONTENTS
Jing Wang , Texas A&M Univ., College Station
D.M. Walker , Texas A&M Univ., College Station
pp. 226-234
From the EIC
Special Issue Features
Zahi Abuhamdeh , TranSwitch
Bob Hannagan , TranSwitch
Jeff Remmers , Plexus Design Solutions
pp. 216-224
Jing Wang , Texas A&M University
Duncan M. (Hank) Walker , Texas A&M University
Xiang Lu , P.A. Semi
Ananta Majhi , NXP Semiconductors
Bram Kruseman , NXP Semiconductors
Guido Gronthoud , NXP Semiconductors
Luis Elvira Villagra , NXP Semiconductors
Paul J.A.M. van de Wiel , NXP Semiconductors
Stefan Eichenberger , NXP Semiconductors
pp. 226-234
Karim Arabi , PMC-Sierra
Resve Saleh , University of British Columbia
Xiongfei Meng , University of British Columbia
pp. 236-244
Sanjay Pant , University of Michigan, Ann Arbor
Eli Chiprout , Intel
David Blaauw , University of Michigan, Ann Arbor
pp. 246-254
Praveen Ghanta , Arizona State University
Sarma Vrudhula , Arizona State University
pp. 256-266
Santiago Remersaro , University of Iowa
Xijiang Lin , Mentor Graphics
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , Purdue University
Janusz Rajski , Mentor Graphics
pp. 268-275
Power Droop Testing (Abstract)
Ilia Polian , Albert-Ludwigs University of Freiburg
Alejandro Czutro , Albert-Ludwigs University of Freiburg
Sandip Kundu , University of Massachusetts, Amherst
Bernd Becker , Albert-Ludwigs University of Freiburg
pp. 276-284
Departments
CEDA Currents (Abstract)
pp. 288-289
Conference Reports (Abstract)
pp. 294-295
The Last Byte
T.M. Mak , Intel
pp. 296
5 ms
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