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Issue No.03 - May-June (2007 vol.24)
pp: 296
T.M. Mak , Intel
ABSTRACT
In the past few years, many researchers have claimed that power issues in test applications are primarily due to scan shifting. The author of this column explains why this conclusion is simply not realistic.
INDEX TERMS
power, test, scan shifting, functional and scan shift speed, static and dynamic power
CITATION
T.M. Mak, "The case for power with test", IEEE Design & Test of Computers, vol.24, no. 3, pp. 296, May-June 2007, doi:10.1109/MDT.2007.87
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