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Issue No.02 - March-April (vol.24)
ISSN: 0740-7475
From the EIC
Advances in Functional Validation through Hybrid Techniques
Jayanta Bhadra , Freescale Semiconductor
Magdy S. Abadir , Freescale Semiconductor
Li-C. Wang , University of California, Santa Barbara
Sandip Ray , University of Texas at Austin
pp. 112-122
Praveen Tiwari , Texas Instruments
pp. 124-131
Sandip Ray , University of Texas at Austin
Rob Sumners , Advanced Micro Devices
pp. 132-139
Franco Fummi , University of Verona
Graziano Pravadelli , University of Verona
Nicola Bombieri , University of Verona
pp. 140-152
Wei-Hsiang Cheng , National Central University
Dong-Jung Lu , AU Optronics
Chin-Lung Chuang , National Central University
pp. 154-162
Built-in Self-Repair
Rei-Fu Huang , Media Tek
Cheng-Wen Wu , National Tsing Hua University
pp. 164-172
Markus Levy , The Multicore Association and EEMBC
Masao Nakaya , Renesas Technology
Pierre Paulin , STMicroelectronics
Ulrich Ramacher , Infineon Technologies
Deepu Talla , Texas Instruments
Wayne Wolf , Princeton University
pp. 174-183
pp. 193-196
CEDA Currents (Abstract)
pp. 200-201
Conference Reports (Abstract)
C.P. Ravikumar , Texas Instruments
Jari Nurmi , Tampere University of Technology
pp. 202-203
Panel Summaries (Abstract)
pp. 204-206
The Last Byte
Losing control (Abstract)
Scott Davidson , Sun Microsystems
pp. 208
8 ms
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