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IEEE Design & Test of Computers
November/December 2006 (vol. 23 no. 6)
ISSN: 0740-7475
Table of Contents
From the EIC
Process Variation and Stochastic Design and Test
Dennis Sylvester, University of Michigan, Ann Arbor
David Blaauw, University of Michigan, Ann Arbor
Eric Karl, University of Michigan, Ann Arbor
pp. 484-490
Interview
Departments
Vladimir Hahanov, Kharkov National University of Radioelectronics
pp. 504-505
IEEE Design & Test of Computers 2006 Annual Index, Volume 23
The Last Byte
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