Issue No.06 - November/December (2006 vol.23)
Shekhar Borkar , Intel
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.156
Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.
technology scaling, VLSI designs, transistor subthreshold leakage, variability, reliability
Shekhar Borkar, "Tackling variability and reliability challenges", IEEE Design & Test of Computers, vol.23, no. 6, pp. 520, November/December 2006, doi:10.1109/MDT.2006.156