The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.06 - November/December (2006 vol.23)
pp: 507
Published by the IEEE Computer Society
ABSTRACT
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Upcoming TTTC Events
7th International Workshop on Microprocessor Test and Verification (MTV 06)
4–5 December 2006
Austin, Texas
http://mtv.ece.ucsb.edu/MTV
This workshop brings together researchers and practitioners from verification and test to discuss today's challenges in the processor and SoC design environments. MTV is the ideal environment for sharing joint test and verification experiences and innovative solutions.
Call for Papers
12th IEEE European Test Symposium (ETS 07)
20–24 May 2007
Freiburg, Germany
http://www.ieee-ets.org
ETS is Europe's premier forum for presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in electronic-based circuit and system testing.
Submissions deadline: 8 December 2006
10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 07)
11–13 April 2007
Kraków, Poland
http://www.iele.polsl.pl/ ddecs2007/files/ddecs2007 -CfP.pdf
This workshop provides a forum for discussing research results and presenting practical applications in design, test, and diagnosis of microelectronic circuits and systems.
Submissions deadline: 10 January 2007
International Conference on Microelectronic Systems Education (MSE 07)
3–4 June 2007
San Diego, Calif.
http://www.mseconference.org
This conference is dedicated to furthering undergraduate and graduate education in designing and building innovative microelectronic systems.
Submissions deadline: 15 January 2007
Past Events
The 5th International Board Test Workshop took place in Fort Collins, Colorado, 13–15 September 2006. BTW 2006 brought attendees from China, Taiwan, Estonia, England, France, and the US. The workshop covered a wide range of topics, including new boundary-scan-based standards for memories, cell phones, and systems; issues with boundary scan and in-circuit testing; concurrent boundary scan testing; functional test coverage; board test economics; a university-developed boundary scan simulation tool; and an insightful perspective on the history and future of DFT. For more information, see http://www.dft.co.uk/BTW2006.
Newsletter Editor's Invitation
I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286; bruce.kim@ieee.org.
Bruce C. Kim
Editor, TTTC Newsletter
20 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool