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| Bruce C. Kim, "TTTC Newsletter," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 507, November/December, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2006.158, author = {Bruce C. Kim}, title = {TTTC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {23}, number = {6}, issn = {0740-7475}, year = {2006}, pages = {507}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.158}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - TTTC Newsletter IS - 6 SN - 0740-7475 SP EP EPD - 507 A1 - Bruce C. Kim, PY - 2006 KW - TTTC KW - test technology KW - MTV 2006 KW - ETS 2007 KW - DDECS 2007 KW - MSE 2007 KW - 5th International Board Test Workshop VL - 23 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.158
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, MTV 2006, ETS 2007, DDECS 2007, MSE 2007, 5th International Board Test Workshop
Citation:
Bruce C. Kim, "TTTC Newsletter," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 507, Nov.-Dec. 2006, doi:10.1109/MDT.2006.158
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