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Issue No.06 - November/December (2006 vol.23)
pp: 504-505
Published by the IEEE Computer Society
Vladimir Hahanov , Kharkov National University of Radioelectronics
ABSTRACT
This report discusses the 2006 IEEE East-West Design & Test International Workshop, held 15 to 19 September 2006 in Sochi, Russia. The goal of the workshop was to exchange experience in design and test of electronic systems among scientific experts from Eastern and Western Europe, as well as other parts of the world.
The 2006 IEEE East-West Design & Test International Workshop (EWDTW) took place from 15 to 19 September in Sochi, Russia. As in past workshops, EWDTW 06 was sponsored by the IEEE Computer Society's Test Technology Technical Council (TTTC). Kharkov National University of Radioelectronics organized this year's workshop, with support from Tallinn University of Technology and Moscow Institute of Control Sciences. Microsoft, Intel, Cadence, and Aldec provided corporate support; and several students—from Russia, Armenia, Ukraine, Iran, Poland, and Bulgaria—benefited from this support.
The goal of the workshop was to exchange experiences in design and test of electronic systems among scientific experts from Eastern and Western Europe, as well as other parts of the world. The audience consisted mainly of professors, technologists, graduate students, and managers from industry. More than 100 attendees from several countries (Ukraine, Russia, Poland, Brazil, Germany, France, the US, Estonia, Byelorussia, the Czech Republic, Latvia, Jordan, Ireland, Armenia, Austria, Finland, Canada, Bulgaria, Italy, Iran, Denmark, Pakistan, and India) participated in the conference.
Western contributions
Researchers from Western countries presented an overview of state-of-the-art design and test trends. Participants from Intel presented "An Algorithm of Circuit Clustering for Logic Synthesis." In this paper, they proposed a new clustering algorithm and compared a cluster-based logic synthesis flow with a flat synthesis flow. Cadence presented a paper called "The Pivotal Role of Performance Management in IC Design." Andre Ivanov, from Canada, presented a tutorial on yield improvement for networks on chips (NoCs). He also presented a report on yield improvement for scan-based circuits.
Eastern contributions
Scientists from Eastern Europe presented an overview of achievements and research results from Eastern countries. Mikhail Karavay, from Russia, presented a tutorial on improving memory fault tolerance. Sergey Mosin, also from Russia, focused on the problem of DFT of analog and mixed-signal electronic circuits. Vladimir Rozenfeld, from Moscow, gave a practical presentation devoted to physical synthesis and optimization. A group from Kharkov National Aerospace University presented reports concerning fault-tolerant systems. A team from Kharkov National University of Radioelectronics presented reports on testable design, parallel computation, hardware-software verification, RFID technologies, functional verification, and simulation of SoCs.
Other topics
The presentations at this year's East-West Design & Test Workshop also covered

    • high-performance network and SoC design and test,

    • modeling and synthesis for embedded systems,

    • system-level modeling,

    • debugging and fault diagnosis,

    • built-in self-repair and reconfigurable architectures,

    • defect-oriented testing,

    • design and test for analog and mixed-signal circuits,

    • BIST,

    • EDA and testing tools for RF circuits,

    • EDA tools for design and synthesis at the architecture and logic levels,

    • embedded-software performance analysis and optimization,

    • formal-verification techniques for complex designs,

    • object-oriented system specification and design, and

    • simulation and test generation.

Microsoft Summer School program
In conjunction with the workshop, Microsoft sponsored a special student program. Students from throughout the world presented reports on testable design, parallel computation, neural networks, finite-state machine theory, test approaches, Bluetooth applications, hardware-software verification, RFID technologies, and functional verification of SoCs. The program also included a wide range of reports devoted to SoC design, hardware-software design, yield improvement for NoCs, high-speed wireless data networking, design and optimization of fault-tolerant systems, and testing for CMOS technologies.
Conclusion
At the workshop's conclusion, organizers decided to host the next workshop in Yerevan, Armenia. Yerevan is a key design and test technology center; it is one of the oldest inhabited cities in the world; and it has a mild, sunny autumn. Let's hope that next year's EWDTW will be even more successful than this year's exciting workshop.
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