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| Vladimir Hahanov, "East-West Design & Test Workshop," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 504-505, November/December, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2006.144, author = {Vladimir Hahanov}, title = {East-West Design & Test Workshop}, journal ={IEEE Design & Test of Computers}, volume = {23}, number = {6}, issn = {0740-7475}, year = {2006}, pages = {504-505}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.144}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - East-West Design & Test Workshop IS - 6 SN - 0740-7475 SP504 EP505 EPD - 504-505 A1 - Vladimir Hahanov, PY - 2006 KW - Eastern Europe KW - Western Europe KW - electronic systems KW - design and test VL - 23 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.144
This report discusses the 2006 IEEE East-West Design & Test International Workshop, held 15 to 19 September 2006 in Sochi, Russia. The goal of the workshop was to exchange experience in design and test of electronic systems among scientific experts from Eastern and Western Europe, as well as other parts of the world.
Index Terms:
Eastern Europe, Western Europe, electronic systems, design and test
Citation:
Vladimir Hahanov, "East-West Design & Test Workshop," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 504-505, Nov.-Dec. 2006, doi:10.1109/MDT.2006.144
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