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Issue No.06 - November/December (2006 vol.23)
pp: 502-503
ABSTRACT
The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate.
INDEX TERMS
electromagnetic compatibility, EMC, portable electronics, electromagnetic environment
CITATION
Fabian Vargas, "Design and test on chip for EMC", IEEE Design & Test of Computers, vol.23, no. 6, pp. 502-503, November/December 2006, doi:10.1109/MDT.2006.143
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