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| ASCII Text | x | ||
| Fabian Vargas, "Design and test on chip for EMC," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 502-503, November/December, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2006.143, author = {Fabian Vargas}, title = {Design and test on chip for EMC}, journal ={IEEE Design & Test of Computers}, volume = {23}, number = {6}, issn = {0740-7475}, year = {2006}, pages = {502-503}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.143}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Design and test on chip for EMC IS - 6 SN - 0740-7475 SP502 EP503 EPD - 502-503 A1 - Fabian Vargas, PY - 2006 KW - electromagnetic compatibility KW - EMC KW - portable electronics KW - electromagnetic environment VL - 23 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.143
The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate.
Index Terms:
electromagnetic compatibility, EMC, portable electronics, electromagnetic environment
Citation:
Fabian Vargas, "Design and test on chip for EMC," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 502-503, Nov.-Dec. 2006, doi:10.1109/MDT.2006.143
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