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November/December 2006 (vol. 23 no. 6)
pp. 502-503
The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate.
Index Terms:
electromagnetic compatibility, EMC, portable electronics, electromagnetic environment
Citation:
Fabian Vargas, "Design and test on chip for EMC," IEEE Design & Test of Computers, vol. 23, no. 6, pp. 502-503, Nov.-Dec. 2006, doi:10.1109/MDT.2006.143
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