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Issue No.05 - September/October (2006 vol.23)
pp: 432
Anne Gattiker , IBM Austin Research Lab
ABSTRACT
A look at plans for the 2006 International Test Conference.
INDEX TERMS
International Test Conference
CITATION
Anne Gattiker, "Getting More out of ITC", IEEE Design & Test of Computers, vol.23, no. 5, pp. 432, September/October 2006, doi:10.1109/MDT.2006.119
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