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September/October 2006 (vol. 23 no. 5)
pp. 432
Anne Gattiker, IBM Austin Research Lab
A look at plans for the 2006 International Test Conference.
Index Terms:
International Test Conference
Citation:
Anne Gattiker, "Getting More out of ITC," IEEE Design & Test of Computers, vol. 23, no. 5, pp. 432, Sept.-Oct. 2006, doi:10.1109/MDT.2006.119
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