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Issue No.05 - September/October (2006 vol.23)
pp: 425
Published by the IEEE Computer Society
ABSTRACT
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Upcoming TTTC Events
12th International Workshop on Thermal Investigations of ICs and Systems
27–29 September 2006
Nice, France
http://tima.imag.fr/conferences/therminic/
Therminic workshops are offered annually to address the essential thermal questions of microelectronic microstructures, and of electronic parts in general. This year's workshop discusses issues in thermal simulation, monitoring, and cooling.
21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 06)
4–6 October 2006
Arlington, Va.
http://netgroup.uniroma2.it/DFT06/cfp.html
DFT provides an open forum for discussing defect and fault tolerance in VLSI systems, including emerging technologies. Topics include all aspects of design, manufacturing, test, reliability, and availability affected by defects during manufacturing or by faults during system operation.
International Test Conference (ITC 06)
24–26 October 2006
Santa Clara, Calif.
http://www.itctestweek.org/
ITC is the world's premier conference on the electronic test of devices, boards, and systems. It covers the complete cycle from design verification, test, diagnosis, and failure analysis to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how academia, design-tool and equipment suppliers, designers, and test engineers address these challenges.
IEEE International Workshop on Current & Defect Based Testing (DBT 06)
26–27 October 2006
Santa Clara, Calif.
http://www.cs.colostate.edu/ ~malaiya/dbt.html
To develop more appropriate fault models, designers and test engineers must have a good handle on both systematic and random defect mechanisms to support the manufacturability of ICs for defect-based test approaches. Because of increasing design complexity and process variability, the focus is shifting to such approaches. This workshop addresses these issues.
First IEEE International Design and Test Workshop (IDT 06)
19–20 November 2006
Dubai, United Arab Emirates
http://www.tttc-idt.org/ index_files/IDT.CFP.06.pdf
This event provides a unique forum in the Middle East and Africa region for researchers and practitioners of VLSI design, test, and fault tolerance to discuss new research ideas and results. IDT will run in conjunction with the annual Innovations of IT Conference and in parallel with Global IT Exhibitions (GITEX).
7th International Workshop on Microprocessor Test and Verification
4–5 December 2006
Austin, Texas
http://mtv.ece.ucsb.edu/MTV
This workshop brings together researchers and practitioners from verification and test to discuss today's difficult challenges in the processor and SoC design environments. It's the ideal environment for joint test and verification experiences and innovative solutions.
Newsletter Editor's Invitation
I'd appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286; bruce.kim@ieee.org.
Bruce C. Kim
Editor, TTTC Newsletter
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