Issue No.05 - September/October (2006 vol.23)
Nisar Ahmed , University of Connecticut
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.127
Structured delay test using scan transition tests is becoming commonplace. But high coverage and compact tests can still be elusive in some situations. The authors propose a novel technique combining the cost-effectiveness of launch-from-capture test with the coverage/pattern volume advantages of launch-from-shift.
delay testing, launch-off-capture, test quality
Nisar Ahmed, "Improving Transition Delay Test Using a Hybrid Method", IEEE Design & Test of Computers, vol.23, no. 5, pp. 402-412, September/October 2006, doi:10.1109/MDT.2006.127