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Issue No.05 - September/October (2006 vol.23)
pp: 402-412
Nisar Ahmed , University of Connecticut
Mohammad Tehranipoor , University of Connecticut
ABSTRACT
Structured delay test using scan transition tests is becoming commonplace. But high coverage and compact tests can still be elusive in some situations. The authors propose a novel technique combining the cost-effectiveness of launch-from-capture test with the coverage/pattern volume advantages of launch-from-shift.
INDEX TERMS
delay testing, launch-off-capture, test quality
CITATION
Nisar Ahmed, Mohammad Tehranipoor, "Improving Transition Delay Test Using a Hybrid Method", IEEE Design & Test of Computers, vol.23, no. 5, pp. 402-412, September/October 2006, doi:10.1109/MDT.2006.127
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