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Improving Transition Delay Test Using a Hybrid Method
September/October 2006 (vol. 23 no. 5)
pp. 402-412
Nisar Ahmed, University of Connecticut
Mohammad Tehranipoor, University of Connecticut
Structured delay test using scan transition tests is becoming commonplace. But high coverage and compact tests can still be elusive in some situations. The authors propose a novel technique combining the cost-effectiveness of launch-from-capture test with the coverage/pattern volume advantages of launch-from-shift.
Index Terms:
delay testing, launch-off-capture, test quality
Citation:
Nisar Ahmed, Mohammad Tehranipoor, "Improving Transition Delay Test Using a Hybrid Method," IEEE Design & Test of Computers, vol. 23, no. 5, pp. 402-412, Sept.-Oct. 2006, doi:10.1109/MDT.2006.127
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