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Issue No.05 - September/October (2006 vol.23)
pp: 390-400
Jeffrey E. Nelson , Carnegie Mellon University
Thomas Zanon , Carnegie Mellon University
Jason G. Brown , Carnegie Mellon University
Osei Poku , Carnegie Mellon University
R.D. (Shawn) Blanton , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
Brady Benware , LSI Logic
Chris Schuermyer , LSI Logic
ABSTRACT
Defect density and size distributions are difficult to characterize, especially if you have little or no access to test vehicles specifically designed for the purpose. The authors propose a new methodology for extracting that information directly from production test data on actual products.
INDEX TERMS
defect density, size distributions, product IC
CITATION
Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R.D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer, "Extracting Defect Density and Size Distributions from Product ICs", IEEE Design & Test of Computers, vol.23, no. 5, pp. 390-400, September/October 2006, doi:10.1109/MDT.2006.117
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