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Issue No.05 - September/October (2006 vol.23)
pp: 388-389
Kenneth M. Butler , Texas Instruments
ABSTRACT
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
INDEX TERMS
International Test Conference, test
CITATION
Kenneth M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test", IEEE Design & Test of Computers, vol.23, no. 5, pp. 388-389, September/October 2006, doi:10.1109/MDT.2006.120
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