Issue No.05 - September/October (2006 vol.23)
Kenneth M. Butler , Texas Instruments
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.120
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
International Test Conference, test
Kenneth M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test", IEEE Design & Test of Computers, vol.23, no. 5, pp. 388-389, September/October 2006, doi:10.1109/MDT.2006.120