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September/October 2006 (vol. 23 no. 5)
pp. 388-389
Kenneth M. Butler, Texas Instruments
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
Index Terms:
International Test Conference, test
Citation:
Kenneth M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test," IEEE Design & Test of Computers, vol. 23, no. 5, pp. 388-389, Sept.-Oct. 2006, doi:10.1109/MDT.2006.120
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