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September/October 2006 (vol. 23 no. 5)
pp. 333
This issue of IEEE Design & Test discusses some of the challenges of electronic system-level design and their corresponding solutions. In addition, a special section highlights the 2006 International Test Conference.
Index Terms:
electronic system-level design, ESL
Citation:
Kwang-Ting (Tim) Cheng, "The New World of ESL Design," IEEE Design & Test of Computers, vol. 23, no. 5, pp. 333, Sept.-Oct. 2006, doi:10.1109/MDT.2006.135
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