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Test Technology TC Newsletter
July/August 2006 (vol. 23 no. 4)
pp. 320-323
| ASCII Text | x | ||
| Bruce C. Kim, "Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 23, no. 4, pp. 320-323, July/August, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2006.107, author = {Bruce C. Kim}, title = {Test Technology TC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {23}, number = {4}, issn = {0740-7475}, year = {2006}, pages = {320-323}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.107}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Technology TC Newsletter IS - 4 SN - 0740-7475 SP320 EP323 EPD - 320-323 A1 - Bruce C. Kim, PY - 2006 KW - TTTC KW - test technology KW - ITC 2005 KW - test technology educational program VL - 23 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.107
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, ITC 2005, test technology educational program
Citation:
Bruce C. Kim, "Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 23, no. 4, pp. 320-323, July-Aug. 2006, doi:10.1109/MDT.2006.107
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