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July/August 2006 (vol. 23 no. 4)
pp. 318-319
Sachin Sapatnekar, University of Minnesota
A review of Leakage in Nanometer CMOS Technologies, edited by Siva G. Narendra and Anantha Chandrakasan (Springer, 2006).
Index Terms:
leakage, nanometer CMOS technology
Citation:
Sachin Sapatnekar, "Book Reviews: Plumbing the Depths of Leakage," IEEE Design & Test of Computers, vol. 23, no. 4, pp. 318-319, July-Aug. 2006, doi:10.1109/MDT.2006.87
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