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Issue No.04 - July/August (2006 vol.23)
pp: 278-293
Dhruva Acharyya , University of Maryland, Baltimore
Jim Plusquellic , University of Maryland, Baltimore
Mohammad Tehranipoor , University of Maryland, Baltimore
Chintan Patel , University of Maryland, Baltimore
Increasing leakage current makes single-threshold IDDQ testing ineffective for differentiating defective and defect-free chips. Quiescent-signal analysis is a new detection and diagnosis technique that uses IDDQ measurements at multiple chip supply ports, reducing the leakage component in each measurement and significantly improving detection of subtle defects. The authors apply regression and ellipse analysis to data collected from 12 test chips to evaluate the technique.
Quiescent Signal Analysis, IDDQ, defect detection
Dhruva Acharyya, Jim Plusquellic, Mohammad Tehranipoor, Chintan Patel, "Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method", IEEE Design & Test of Computers, vol.23, no. 4, pp. 278-293, July/August 2006, doi:10.1109/MDT.2006.102
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