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Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method
July/August 2006 (vol. 23 no. 4)
pp. 278-293
Jim Plusquellic, University of Maryland, Baltimore
Dhruva Acharyya, University of Maryland, Baltimore
Abhishek Singh, University of Maryland, Baltimore
Mohammad Tehranipoor, University of Maryland, Baltimore
Chintan Patel, University of Maryland, Baltimore
Increasing leakage current makes single-threshold IDDQ testing ineffective for differentiating defective and defect-free chips. Quiescent-signal analysis is a new detection and diagnosis technique that uses IDDQ measurements at multiple chip supply ports, reducing the leakage component in each measurement and significantly improving detection of subtle defects. The authors apply regression and ellipse analysis to data collected from 12 test chips to evaluate the technique.
Index Terms:
Quiescent Signal Analysis, IDDQ, defect detection
Citation:
Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel, "Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method," IEEE Design & Test of Computers, vol. 23, no. 4, pp. 278-293, July-Aug. 2006, doi:10.1109/MDT.2006.102
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