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Conference Reports
July/August 2006 (vol. 23 no. 4)
pp. 262-265
Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).
Index Terms:
Logic Soft Errors, conference report
Citation:
Mitra Subhasish, Ondrej Novak, Hana Kubatova, Bashir M. Al-Hashimi, Erik Jan Marinissen, C.P. Ravikumar, "Conference Reports," IEEE Design & Test of Computers, vol. 23, no. 4, pp. 262-265, July-Aug. 2006, doi:10.1109/MDT.2006.91
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