This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
July/August 2006 (vol. 23 no. 4)
pp. 261
A popular DATE keynote speaker and an award-winning author are among the contributors to this issue, which covers on-chip testing, the sociology of EDA, quiescent-signal analysis, and a survey of test vector compression techniques.
Index Terms:
DATE, EDA, quiescent-signal analysis, est vector compression
Citation:
Kwang-Ting (Tim) Cheng, "Vision from the Top," IEEE Design & Test of Computers, vol. 23, no. 4, pp. 261, July-Aug. 2006, doi:10.1109/MDT.2006.108
Usage of this product signifies your acceptance of the Terms of Use.