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May/June 2006 (vol. 23 no. 3)
pp. 250
Bruce C. Kim, University of Alabama
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, ITC 2005, test technology educational program
Citation:
Bruce C. Kim, "Test Technology Technical Council Newsletter," IEEE Design & Test of Computers, vol. 23, no. 3, pp. 250, May-June 2006, doi:10.1109/MDT.2006.81
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